MAPLESOFT News

New MapleSim release from Maplesoft provides an enhanced multidomain modeling tool that helps designers build better machines

Maplesoft today announced a new release of MapleSim that makes it even easier for engineers to improve the design of machines that incorporate elements from multiple engineering domains. MapleSim is an advanced modeling and simulation tool that helps machine designers reduce development time, lower costs, and diagnose real-world performance issues, with its flexible modeling environment, built-in analysis tools, and connectivity to automation systems.

Binder News

Designed for power applications in North America

Use in control cabinets for the North-American market requires specific testing and certification of the components. In the case of power applications, they are subject to the UL 2237 standard. binder's 823 and 824 series of compact cable connectors have been developed according to this standard.

Hitachi News

Hitachi High-Tech Launches Dark Field Wafer Defect Inspection System DI2800, Achieving High-Sensitivity 100% Inspection for Semiconductor Devices in the IoT and Automotive Fields

Helping to improve the reliability and safety of semiconductor devices in the IoT and automotive fields. Hitachi High-Tech Corporation has announced the launch of the Hitachi Dark Field Wafer Defect Inspection System DI2800, a critical component in any semiconductor manufacturer's metrology capabilities.

Texas Instruments News

New processors make edge AI more accessible while cutting power consumption in half

Expanding on its history of delivering highly integrated processors, Texas Instruments (TI) today introduced new Sitara AM62 processors that help expand edge artificial intelligence (AI) processing into next-generation applications. The low-power design of the new processors enables support for dual-screen displays and small-size human-machine interface (HMI) applications.

SMB Bearings News

Resolving the global semiconductor shortage

Semiconductor chips store data on almost every modern digital device that we use. According to ASML, in 2020, more than one trillion chips were produced around the world. Despite their use in many of the products we rely on, the manufacturing process is complex and requires precision.

WAE News

Williams Advanced Engineering (WAE) and Imperial College London supporting Faraday Institution funded BESAFE project to advance the understanding of the initiation and propagation of thermal runaway

Imperial College London and Williams Advanced Engineering (WAE) are working on a project to bridge the gap between thermofluid science and battery electrochemistry; developing a first-of-a-kind multiphase multiphysics model of battery failure via thermal runaway (a self-sustaining cascade of exothermic reactions that produce large volumes of gas).

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