EDAX introduces Velocity Ultra – The fastest EBSD camera in the world
AMETEK EDAX, LLC, a leader in X-ray microanalysis and electron diffraction instrumentation, launched a new, faster, low-noise CMOS camera to its Velocity Electron Backscatter Diffraction (EBSD) Camera Series. The Velocity Ultra is now the fastest EBSD camera in the world, offering high-speed EBSD mapping with the highest indexing performance on real-world materials.
The Velocity EBSD Camera Series now includes four cameras tailored to specific EBSD analysis applications:
- Velocity Ultra – Collection speeds up to 6,700 indexed points per second (ipps)
- Velocity Super – Collection speeds up to 4,500 ipps
- Velocity Plus – Collection speeds up to 3,000 ipps
- Velocity Pro – Collection speeds up to 2,000 ipps
Powered by a CMOS sensor optimized for high-speed EBSD, the Velocity EBSD Camera Series combines indexing speeds up to 6,700 indexed points per second with indexing success rates of 99% or better. This image resolution, combined with the proven EDAX Triplet Indexing routine, provides orientation precision values of less than 0.1°.
“We are very excited to add the Ultra to the EDAX Velocity Series,” “Increasing the acquisition speed of our EBSD detectors lets our users use their scanning electron microscope time more efficiently and improves characterization capability for dynamic experiments where speed is critical,” said EBSD Product Manager Matt Nowell.
The Velocity EBSD Series can be integrated with compatible EDAX Energy Dispersive Spectroscopy (EDS) detectors to provide an analytical system for efficient simultaneous EDS-EBSD collection, even at the highest collection speeds. Furthermore, the collection can be combined with ChI-Scan™ analysis for results with useful, integrated data for accurate phase differentiation.
“This new addition to our Velocity series of EBSD cameras within the EDAX portfolio offers users another option for high-speed mapping and accurate indexing. These new cameras help resolve crystallographic microstructures and solve materials characterization challenges quickly and easily,” stated Vice President – Electron Microscopy Technologies Narayan Vishwanathan.
For further information, visit www.edax.com/velocity.
www.edax.com
